Dielectric properties of Ag/Ru 0.03 –PVA/n-Si structures

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BADALI Y., Koçyığıt S., Uslu I., ALTINDAL Ş.

Bulletin of Materials Science, cilt.42, sa.5, 2019 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 42 Sayı: 5
  • Basım Tarihi: 2019
  • Doi Numarası: 10.1007/s12034-019-1875-4
  • Dergi Adı: Bulletin of Materials Science
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Anahtar Kelimeler: Ag/Ru 0.03–PVA/n-Si, frequency dependence, impedance spectroscopy, surface states
  • İstanbul Ticaret Üniversitesi Adresli: Hayır

Özet

Ag/Ru 0.03- PVA /n-Si structures were successfully prepared and their morphological and electrical properties were investigated. The obtained electrical results suggested that the complex dielectric constant (ε∗= ε′- jε″), complex electric modulus M∗= M′+ jM″, loss tangent (tan δ) and alternating current (ac) electrical conductivity (σac) are all a strong function of the frequency (f) and applied voltage. The changes in these parameters are the results of the existence of the surface states (Nss) or interface traps (Dit= Nss) , interfacial polymer layer, surface and dipole polarizations and hopping mechanisms. The values of ε′ and ε″ show a steep decline with increasing frequency and then reach a constant value at high frequency, whereas the increments of M′ and M″ with frequency are exponential. The tan δvs. log f plot has a strong peak behaviour, especially in the accumulation region. These experimental results suggested that the Ru 0.03- PVA interfacial layer could be used as a high dielectric material instead of conventional materials.