BADALI, Y. Et Al. 2020. Investigation of the effect of different Bi2O3–x:PVA (x = Sm, Sn, Mo) thin insulator interface-layer materials on diode parameters. Journal of Materials Science: Materials in Electronics , vol.31, no.10 , 8033-8042.

BADALI, Y., Azizian-Kalandaragh, Y., Uslu, İ., & ALTINDAL, Ş., (2020). Investigation of the effect of different Bi2O3–x:PVA (x = Sm, Sn, Mo) thin insulator interface-layer materials on diode parameters. Journal of Materials Science: Materials in Electronics , vol.31, no.10, 8033-8042.

BADALI, YOSEF Et Al. "Investigation of the effect of different Bi2O3–x:PVA (x = Sm, Sn, Mo) thin insulator interface-layer materials on diode parameters," Journal of Materials Science: Materials in Electronics , vol.31, no.10, 8033-8042, 2020

BADALI, YOSEF Et Al. "Investigation of the effect of different Bi2O3–x:PVA (x = Sm, Sn, Mo) thin insulator interface-layer materials on diode parameters." Journal of Materials Science: Materials in Electronics , vol.31, no.10, pp.8033-8042, 2020

BADALI, Y. Et Al. (2020) . "Investigation of the effect of different Bi2O3–x:PVA (x = Sm, Sn, Mo) thin insulator interface-layer materials on diode parameters." Journal of Materials Science: Materials in Electronics , vol.31, no.10, pp.8033-8042.

@article{article, author={YOSEF BADALI Et Al. }, title={Investigation of the effect of different Bi2O3–x:PVA (x = Sm, Sn, Mo) thin insulator interface-layer materials on diode parameters}, journal={Journal of Materials Science: Materials in Electronics}, year=2020, pages={8033-8042} }