AZIZIAN-KALANDARAGH, Y. And Badali, Y. 2025. Dielectric characterization of the Al/p-Si structure with porous silicon wafer. Applied Physics A: Materials Science and Processing , vol.131, no.8 .

AZIZIAN-KALANDARAGH, Y., & Badali, Y., (2025). Dielectric characterization of the Al/p-Si structure with porous silicon wafer. Applied Physics A: Materials Science and Processing , vol.131, no.8.

AZIZIAN-KALANDARAGH, YASHAR, And YOSEF BADALI. "Dielectric characterization of the Al/p-Si structure with porous silicon wafer," Applied Physics A: Materials Science and Processing , vol.131, no.8, 2025

AZIZIAN-KALANDARAGH, YASHAR And Badali, YOSEF. "Dielectric characterization of the Al/p-Si structure with porous silicon wafer." Applied Physics A: Materials Science and Processing , vol.131, no.8, 2025

AZIZIAN-KALANDARAGH, Y. And Badali, Y. (2025) . "Dielectric characterization of the Al/p-Si structure with porous silicon wafer." Applied Physics A: Materials Science and Processing , vol.131, no.8.

@article{article, author={YASHAR AZIZIAN-KALANDARAGH And author={YOSEF BADALI}, title={Dielectric characterization of the Al/p-Si structure with porous silicon wafer}, journal={Applied Physics A: Materials Science and Processing}, year=2025}